MSE 6160 - Scanning Electron Microscopy and Related Techniques

Effective Start Date: 03/01/2009
Covers the physical principles of scanning electron microscopy and electron probe microanalysis. Laboratory demonstrations and experiments cover the operation of the SEM and EPMA. Applications of secondary and backscattered electron imaging, energy dispersive x-ray microanalysis, wave- analysis are applied to materials characterization. Laboratory experiments may include either materials science or biological applications, depending on the interests of the student. Prerequisite: Instructor permission.

Credits: 3
Grading Basis: Student Option

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