Jan 28, 2025  
Graduate Record 2007-2008 
    
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Graduate Record 2007-2008 [ARCHIVED RECORD]

ECE 768 - Semiconductor Materials and Characterization Techniques

Analyzes semiconductor growth and characterization methods applicable to III-V heteroepitaxial growth along with etching and contact formation mechanisms; and the physical, structural, and electrical characterization tools including X-ray diffraction, Auger, Hall and C(V). (Y)

Prerequisites & Notes
Prerequisite: ECE 663 or instructor permission.

Credits: 3