Mar 17, 2026  
Graduate Record 2011-2012 
    
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Graduate Record 2011-2012 [ARCHIVED RECORD]

MSE 7130 - Advanced Electron Microscopy

Emphasis placed on the applications of advanced techniques of transmission and scanning electron microscopy to modern research problems in materials science and engineering. Microdiffraction and microanalysis, lattice imaging, and convergent beam diffraction in TEM and STEM are treated. In SEM, quantitative probe analysis techniques and back scattered electron imaging and channeling are covered. Prerequisite: MSE 703 or instructor permission.



Credits: 3