Mar 29, 2024  
Graduate Record 2018-2019 
    
Graduate Record 2018-2019 [ARCHIVED RECORD]

MSE 7130 - Advanced Electron Microscopy


Emphasis placed on the applications of advanced techniques of transmission and scanning electron microscopy to modern research problems in materials science and engineering. Microdiffraction and microanalysis, lattice imaging, and convergent beam diffraction in TEM and STEM are treated. In SEM, quantitative probe analysis techniques and back scattered electron imaging and channeling are covered. Prerequisite: MSE 6130 or instructor permission.



Credits: 3