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Apr 19, 2024
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Graduate Record 2010-2011 [ARCHIVED RECORD]
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ECE 7168 - Semiconductor Materials and Characterization Techniques Analyzes semiconductor growth and characterization methods applicable to III-V heteroepitaxial growth along with etching and contact formation mechanisms; and the physical, structural, and electrical characterization tools including X-ray diffraction, Auger, Hall and C(V). Prerequisite: ECE 663 or instructor permission.
Credits: 3
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