May 23, 2024  
Graduate Record 2007-2008 
Graduate Record 2007-2008 [ARCHIVED RECORD]

MSE 706 - Advanced Electron Microscopy

Emphasis placed on the applications of advanced techniques of transmission and scanning electron microscopy to modern research problems in materials science and engineering. Microdiffraction and microanalysis, lattice imaging, and convergent beam diffraction in TEM and STEM are treated. In SEM, quantitative probe analysis techniques and back scattered electron imaging and channeling are covered. (E)

Prerequisites & Notes
Prerequisite: MSE 703 or instructor permission.

Credits: 3