May 24, 2024  
Graduate Record 2007-2008 
Graduate Record 2007-2008 [ARCHIVED RECORD]

ECE 768 - Semiconductor Materials and Characterization Techniques

Analyzes semiconductor growth and characterization methods applicable to III-V heteroepitaxial growth along with etching and contact formation mechanisms; and the physical, structural, and electrical characterization tools including X-ray diffraction, Auger, Hall and C(V). (Y)

Prerequisites & Notes
Prerequisite: ECE 663 or instructor permission.

Credits: 3