Sep 19, 2019  
Graduate Record 2007-2008 
    
Graduate Record 2007-2008 [ARCHIVED RECORD]

ECE 768 - Semiconductor Materials and Characterization Techniques


Analyzes semiconductor growth and characterization methods applicable to III-V heteroepitaxial growth along with etching and contact formation mechanisms; and the physical, structural, and electrical characterization tools including X-ray diffraction, Auger, Hall and C(V). (Y)

Prerequisites & Notes
Prerequisite: ECE 663 or instructor permission.

Credits: 3